日韩黄色av网站免费-男人的天堂亚洲中文在线-亚洲欧美日韩高清一区-日本精品999在线观看

歡迎來到蘇州英飛思科學儀器有限公司網(wǎng)站!
咨詢熱線

18962188051

當前位置:首頁  >  技術文章  >  什么是X射線熒光鍍層涂層測厚法?

什么是X射線熒光鍍層涂層測厚法?

更新時間:2021-08-03      點擊次數(shù):2354

什么是X射線熒光鍍層涂層測厚法?

材料的涂層厚度是一個重要的工藝參數(shù)。它直接影響零件或產(chǎn)品的耐腐蝕性、裝飾效果、導電性、產(chǎn)品可靠性和使用壽命。因此,涂層的厚度在產(chǎn)品質量、工藝控制和成本控制中起著重要作用。


什么是電鍍/涂層?


電鍍是指在一些物品的金屬表面涂上一層有機物,或薄薄的一層金屬或仿制某種貴金屬,為了美觀或存放,在普通金屬表面鍍上這種貴金屬。 .復合鍍層的制備是在鍍液中加入一種或幾種不溶性固體顆粒,使固體顆粒與金屬離子共沉積的過程。它實際上是一種金屬基復合材料。


什么是涂層厚度測試?有哪些方法?


涂層厚度測試檢測材料表面金屬和氧化物涂層的厚度。鍍層厚度的測量方法主要有金相法、X射線熒光法和掃描電子顯微鏡測量法等。


XRF鍍層測厚儀俗稱X射線熒光測厚儀、鍍層測厚儀、薄膜測厚儀、薄膜測厚儀、金鎳測厚儀、電鍍薄膜測厚儀等,主要用于精確測量涂層的厚度。金屬電鍍層。


XRF涂層測厚儀:


俗稱X射線熒光測厚儀、鍍層測厚儀、薄膜測厚儀、薄膜測厚儀、金鎳測厚儀、電鍍薄膜測厚儀等;




功能:精密測量金屬鍍層厚度;



應用范圍:測量涂層、涂層、薄膜、液體的厚度或成分,測量范圍從12(Mg)到92(U)


使用X射線的非接觸式厚度測量裝置可以讓探測器檢測穿透目標物體的量子X射線量,或穿透目標物體的熒光X射線量來測量厚度的目標對象。探測器探測到的量子X射線或熒光X射線的數(shù)量因目標物體的材料而異,其吸收系數(shù)、密度和厚度各不相同。無需比較目標物體的量子 X 射線量和穿過目標物體并從 X 射線目標發(fā)射的 X 射線量。厚度。


校準曲線是通過比較具有基層的參考樣品的基層和由其上形成的薄膜層形成的基層中特定元素散射的信號強度與薄層厚度之間的差異來確定的。通過將具有基層的參考樣品的基層和其上形成有基層的目標樣品的基層中的特定元素散射的信號與校準進行比較來確定目標樣品膜層厚度。


典型的鍍層厚度光譜圖(鐵鍍鎳鍍金)


The coating thickness of the material is an important process parameter. It directly affects the corrosion resistance, decorative effect, electrical conductivity, product reliability and service life of parts or products. Therefore, the thickness of the coating plays an important role in product quality, process control, and cost control.


What is plating/coating?


Plating refers to coating a layer of organic matter, or a thin layer of metal or imitating some kind of precious metal, on the metal surface of some items for good-looking or storage, and plating this precious metal on the surface of ordinary metal. . The preparation of composite coating is a process of adding one or several insoluble solid particles to the plating solution to co-deposit the solid particles and metal ions. It is actually a metal-based composite material.


What is the coating thickness test? What are the methods?


Coating thickness test detects the thickness of metal and oxide coatings on the surface of the material. The measurement methods of coating thickness mainly include metallographic method, X-ray fluorescence method and scanning electron microscope measurement method and so on.


XRF coating thickness gauges are commonly known as X-ray fluorescence thickness gauges, coating thickness gauges, film thickness gauges, film thickness testers, gold-nickel thickness testers, electroplating film thickness gauges, etc. They are mainly used to accurately measure the thickness of metal electroplating layers.


XRF coating thickness gauge:


Commonly known as X-ray fluorescence thickness gauge, coating thickness gauge, film thickness gauge, film thickness tester, gold nickel thickness tester, electroplating film thickness gauge, etc.;


Function: precise measurement of the thickness of the metal plating layer;


Application range: measuring the thickness or composition of coatings, coatings, films, liquids, measuring range from 12 (Mg) to 92 (U)


The non-contact thickness measuring device using X-rays can allow the amount of quantum X-rays penetrating the target object to be detected by the detector, or the amount of fluorescent X-rays penetrating the target object to be detected to measure the thickness of the target object. The amount of quantum X-rays or fluorescent X-rays detected by the detector in response to the material of the target object varies in absorption coefficient, density, and thickness. It is not necessary to compare the amount of quantum X-rays of the target object and the amount of X-rays irradiated to pass through the target object and emitted from the X-ray target. thickness.


The calibration curve is determined by comparing the difference between the intensity of the signal scattered by the specific element in the base layer of the reference sample having the base layer and the base layer formed by the thin film layer formed thereon with the thickness of the thin film layer, and The target is determined by comparing the intensity difference between the signal scattered by a specific element in the base layer of the reference sample having the base layer and the base layer of the target sample having the base layer formed thereon with the calibration curve. The thickness of the film layer of the sample


蘇州英飛思科學儀器有限公司
  • 聯(lián)系人:張經(jīng)理
  • 地址:江蘇省蘇州工業(yè)園區(qū)唯新路69號一能科技園2幢407
  • 郵箱:sales@esi-xrf.com
  • 傳真:
關注我們

歡迎您加我微信了解更多信息

掃一掃
聯(lián)系我們
版權所有©2024蘇州英飛思科學儀器有限公司All Rights Reserved    備案號:蘇ICP備2021018034號-2    sitemap.xml    總流量:165336
管理登陸    技術支持:化工儀器網(wǎng)    
日韩国产传媒视频在线观看| 青青草网站在线观看视频| 蜜臀国产午夜在线视频| 日韩视频播放一区二区| 久久免费观看性生活片| 亚洲国产成在人网站天堂| 成人av影视中文字幕| 手机在线观看午夜小视频| 另类激情综合在线观看| 欧美高清一区二区在线播放| 日韩欧美一区二区麻豆| 69国产精品久久久久久人| 国产三级精品在线免费| 久久精品一区二区三区乱码| 蜜桃臀视频一区二区三区| 在线蜜臀av中文字幕| 国产精品一级片免费看| 久久精品国产亚洲av高清观看| 国产精品自拍激情在线观看| 精品一区二区日本高清| 激情五月,开心五月深情五月| 日韩精品在线观看天堂| 午夜精品一区二区三区亚洲| 国产一级成人免费视频| 欧美激情三级一区二区| 国产亚洲精品视频在线网| 亚洲av在线av天堂| 视频二区国产欧美日韩| 密桃精品一区二区三区在线观看| 日本在线一区二区中文| 午夜在线观看成人av| 日韩精品毛片精品一区到三区| 欧美国产日韩在线一区二区三区| 成人激情在线免费电影| 97免费在线视频观看| 国产黄色大片在线关看| 国产精品亚洲欧美中字| 日韩性视频激情在线一区| 欧美日韩一区二区午夜福利| 亚洲综合国产一二三四五区| 久久久国产一区二区三区|